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Brief Introduction to Fuzzy Sets BOOK CHAPTER published 1995 in Reliability and Safety Analyses under Fuzziness |
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Networks on Chip; Axel Jantsch, Hannu Tenhunen (Eds.). Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 303, plus VIII, euro 117. ISBN 1-4020-7392-5 JOURNAL ARTICLE published May 2004 in Microelectronics Reliability |
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Networks on Chip; Axel Jantsch, Hannu Tenhunen (Eds.). Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 303, plus VIII, euro 117. ISBN 1-4020-7392-5 JOURNAL ARTICLE published July 2004 in Microelectronics Reliability |
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Interconnecting and Computing over Satellite Networks; Yongguang Zhang (Ed.). Kluwer Academic Publishers, Boston, 2003. Hardcover, pp. 262, plus XXII, 128€. ISBN 1-4020-7424-7 JOURNAL ARTICLE published February 2004 in Microelectronics Reliability |
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A designer’s guide to built-in self-test; Charles E. Stround. Kluwer Academic Publishers, Boston, 2002. Hardcover, pp. 319, plus XVI, $ 125, ISBN 1-4020-7050-0 JOURNAL ARTICLE published March 2003 in Microelectronics Reliability |
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System on chip design languages; Anne Mignotte, Eugenio Villar, Lynn Horobin, editors, Kluwer Academic Publishers, Boston, 2002. Hardcover, pp. 283, plus IX, 141 €. ISBN 1-4020-7046-2 JOURNAL ARTICLE published January 2004 in Microelectronics Reliability |
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Memory architecture exploration for programmable embedded systems; Peter Grun, Nikil Dutt, Alexandru Nicolau. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp. 128, plus XVII, 116 euro. ISBN 1-4020-7324-0. JOURNAL ARTICLE published May 2004 in Microelectronics Reliability |
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CMOS Telecom Data converters; Angel Rodriguez-Vazquez, Fernando Medeiro, Edmond Janssens, editors. Kluwer Academic Publishers, Boston; 2003. Hardcover, 588pp, plus XXXIII, 128 euro. ISBN 1-4020-7546-4 JOURNAL ARTICLE published December 2004 in Microelectronics Reliability |
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Power Distribution Networks in High Speed Integrated Circuits; Andrey Mezhiba, Eby Friedman. Kluwer Academic Publishers, Boston; 2004. Hardcover, 280pp, plus XXIII, 129 euro. ISBN 1-4020-7534-0 JOURNAL ARTICLE published August 2004 in Microelectronics Reliability |
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Design and control of RF power amplifier; Alireza Shirvani, Bruce Wooley. Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 149, plus XVI, 127 euro. ISBN 1-4020-7562-6 JOURNAL ARTICLE published December 2004 in Microelectronics Reliability |
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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test; R. Dean Adams, Kluwer Academic Publishers, Boston, 2003, Hardcover, pp. 247, plus XIII, €142, ISBN 1-4020-7255-4 JOURNAL ARTICLE published May 2003 in Microelectronics Reliability |
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Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp. 178, plus XI, ISBN 1-4020-7235-X, €107 JOURNAL ARTICLE published March 2004 in Microelectronics Reliability |
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Oversampled delta-sigma modulators: analysis applications and novel topologies; Mücahit Kozak, Izzet Kale. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp. 226, plus XII, 112 euro. ISBN 1-4020-7420-4. JOURNAL ARTICLE published June 2004 in Microelectronics Reliability |
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Design criteria for low distortion in feedback OPAMP circuits; Bjornar Hernes, Trond Saether, Kluwer Academic Publishers, Boston, 2003. Hardcover, pp. 160, plus XXV, 110 €. ISBN 1-4020-7356-9 JOURNAL ARTICLE published January 2004 in Microelectronics Reliability |
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System Design with System C; Thorsten Grotker, Stan Liao, Grant Martin, Stuart Swan. Kluwer Academic Publishers, Boston, 2002. Hardcover, pp. 217, plus X, $110, ISBN 1-4020-7027-1 JOURNAL ARTICLE published April 2003 in Microelectronics Reliability |
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Memory Design Techniques for Low Energy Embedded Systems; Alberto Macii, Luca Benini, Massimo Poncino. Kluwer Academic Publishers, Boston, USA, 2002. Hard cover, pp. 144 plus XI, $105. ISBN 0-7923-7690-0 JOURNAL ARTICLE published March 2003 in Microelectronics Reliability |
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Memory architecture exploration for programmable embedded systems; Peter Grun, Nikil Dutt, Alexandru Nicolau. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp. 128, plus XVII, 116 euro. ISBN 1-4020-7324-0. JOURNAL ARTICLE published July 2004 in Microelectronics Reliability |
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Book review: Intellectual property protection in VLSI designs: Theory and practice, Hardcover, pp. 183, plus XIX, 106 euro, Kluwer Academic Publishers, Boston, 2003, ISBN 1-4020-7320-8 JOURNAL ARTICLE published April 2004 in Microelectronics Reliability |
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Low-voltage CMOS log companding analog design; Francisco Sera-Graells, Andoracion Rueda, Jose L. Huertas. Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 192, plus XXV, 117 euro. ISBN 1-4020-7445-X JOURNAL ARTICLE published December 2004 in Microelectronics Reliability |
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Power estimation and optimization for VLIW-based embedded systems; Vittorio Zaccaria, Mariagiovanna Sami, Donatella Sciuto, Cristina Silvano. Hardcover, pp. 203, plus XXIV, 107 euro. Kluwer Academic Publishers, Boston, 2003. ISBN 1-4020-7377-1 JOURNAL ARTICLE published April 2004 in Microelectronics Reliability |